Abstract
In this study, wetting tests for Ni substrate with eutectic Ga-Sn-Zn are carried out using the sessile drop method. The experiments are performed for 1, 10 and 30 days of contact, at temperatures of 100°C, 150°C and 250°C. Selected liquid/substrate couples are cross-sectioned and subjected to scanning electron microscopy with energy dispersive spectroscopy for interfacial microstructure investigation. Phase identification is carried out using synchrotron x-ray diffraction. The growth of the intermetallic Ni-Ga phase layer is studied at the liquid/Ni substrate interface, and the kinetics of the formation and growth of this layer are determined.