Preparation and characterization of X-ray mirrors with three single layers of a-C, B4C and Ni onto two 820 mm long Si substrate
No abstract available.
URL: https://publications.hereon.de/id/32983/
Authors:Stoermer, M., Siewert, F., Buchheim, J., Pilz, A., Kuhlmann, M., Ploenjes, E., tiedtke, K.
Year:2014
In: Advances in X-Ray/EUV Optics and Components IX
Location:San Diego, CA (USA)
Date:18.-20.08.2014
Cite as: Stoermer, M.; Siewert, F.; Buchheim, J.; Pilz, A.; Kuhlmann, M.; Ploenjes, E.; tiedtke, K.: Preparation and characterization of X-ray mirrors with three single layers of a-C, B4C and Ni onto two 820 mm long Si substrate. In: Advances in X-Ray/EUV Optics and Components IX. San Diego, CA (USA), 18.-20.08.2014, 2014.
