Tomographic Analysis and FE-Simulations of MMC-Microstructures under Load
No abstract available.
URL: https://publications.hereon.de/id/24896/
Authors:Crostack, H.-A.,Nellesen, J.,Fischer, G.,Schmauder, S.,Weber, U.,Beckmann, F.
Year:2006
In: X-ray, Gamma Ray, and Particle Technologies, Developments in X Ray Tomography V, Optics and Photonics, SPIE 2006
Location:San Diego, CA (USA)
Date:15.-17.08.2006
Pages:63181A
Type:conference paper
ISBN: 0-8194-6439-2
Cite as: Crostack, H.; Nellesen, J.; Fischer, G.; Schmauder, S.; Weber, U.; Beckmann, F.: Tomographic Analysis and FE-Simulations of MMC-Microstructures under Load. In: X-ray, Gamma Ray, and Particle Technologies, Developments in X Ray Tomography V, Optics and Photonics, SPIE 2006. San Diego, CA (USA). 2006. 63181A.
