Full-Field and Scanning Microtomography Based on Parabolic Refractive X-Ray Lenses
No abstract available.
URL: https://publications.hereon.de/id/24878/
Authors:Schroer, C.G., Kuhlmann, M., Guenzler, T.F., Benner, B., Kurapova, C., Patommel, J., Lengeler, B., Roth, S.V., Gehrke, R., Snigirev, A., Snigireva, I., Almendarez-Camarillo, A., Beckmann, F.
Year:2006
In: Optics and Photonics, SPIE 2006
Location:San Diego, CA (USA)
Date:15.-17.08.2006
Cite as: Schroer, C.G.; Kuhlmann, M.; Guenzler, T.F.; Benner, B.; Kurapova, C.; Patommel, J.; Lengeler, B.; Roth, S.V.; Gehrke, R.; Snigirev, A.; Snigireva, I.; Almendarez-Camarillo, A.; Beckmann, F.: Full-Field and Scanning Microtomography Based on Parabolic Refractive X-Ray Lenses. In: Optics and Photonics, SPIE 2006. San Diego, CA (USA), 15.-17.08.2006, 2006.
