3-dimensional strain fields from tomographic measurements

Confpaper

No abstract available.

URL: https://publications.hereon.de/id/24870/
Authors:Haldrup, K., Nielsen, S.F., Mishnaevsky, L.Jr., Beckmann, F., Wert, J.A.
Year:2006
In: X-ray, Gamma Ray, and Particle Technologies, Developments in X Ray Tomography V, Optics and Photonics, SPIE 2006
Volume:6318
Location:San Diego, CA (USA)
Date:15.-17.08.2006
Pages:63181B
Type:Confpaper
ISBN: 0-8194-6439-2
Cite as: Haldrup, K.; Nielsen, S.F.; Mishnaevsky, L.Jr.; Beckmann, F.; Wert, J.A.: 3-dimensional strain fields from tomographic measurements. In: X-ray, Gamma Ray, and Particle Technologies, Developments in X Ray Tomography V, Optics and Photonics, SPIE 2006. Vol. 6318 San Diego, CA (USA), 15.-17.08.2006, 2006. 63181B. (ISBN: 0-8194-6439-2)