Creep Behavior and Microstructural Stability of Lamellar Gamma-TiAl (Cr, Mo, SI, B) with Extremely Fine Lamellar Spacing
No abstract available.
URL: https://publications.hereon.de/id/24154/
Authors:Schillinger, W., Zhang, D., Dehm, G., Bartels, A., Clemens, H.
Year:2000
In: Materials Research Society Symposium
Location:Bosten, MA (USA)
Date:27.11.-01.12.2000
Cite as: Schillinger, W.; Zhang, D.; Dehm, G.; Bartels, A.; Clemens, H.: Creep Behavior and Microstructural Stability of Lamellar Gamma-TiAl (Cr, Mo, SI, B) with Extremely Fine Lamellar Spacing. In: Materials Research Society Symposium. Bosten, MA (USA), 27.11.-01.12.2000, 2000.
