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conference paper
Creep Behavior and Microstructural Changes During Short-Term Creep in a y-TiAl Based Alloy with Fully Lamellar Microstructure
No abstract available.
URL:
https://publications.hereon.de/id/22693/
Authors:
Chatterjee, A.,Clemens, H.,Dehm, G.,Mecking, H.,Kestler, H.,Arzt, E.
Year:
2003
In:
Gamma Titanium Aluminides, TMS Annual Meeting 2003
Location:
San Diego, CA (USA)
Date:
02.-06.03.2003
Pages:
425-430
Type:
conference paper
ISBN:
0-87339-543-3
Cite as:
Chatterjee, A.; Clemens, H.; Dehm, G.; Mecking, H.; Kestler, H.; Arzt, E.: Creep Behavior and Microstructural Changes During Short-Term Creep in a y-TiAl Based Alloy with Fully Lamellar Microstructure. In: Kim, Y.; Clemens, H.; Rosenberger, A. (Ed.): Gamma Titanium Aluminides, TMS Annual Meeting 2003. San Diego, CA (USA). 2003. 425-430.
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