Creep Properties and Texture of a High Niobium Containing Gamma TiAl Sheet Material
No abstract available.
URL: https://publications.hereon.de/id/22662/
Authors:Bystrzanowski, S., Bartels, A., Gerling, R., Schimansky, F.P., Kestler, H., Weller, M., Clemens, H.
Year:2004
In: Ti-2003, Science and Technology, Proceedings of the 10th World Conference on Titanium
Volume:4
Location:Hamburg (D)
Date:13.-18.07.2003
Pages:2401 - 2408
Type:Confpaper
ISBN: 3-527-30306-5
Cite as: Bystrzanowski, S.; Bartels, A.; Gerling, R.; Schimansky, F.P.; Kestler, H.; Weller, M.; Clemens, H.: Creep Properties and Texture of a High Niobium Containing Gamma TiAl Sheet Material. In: Luetjering, G.; Albrecht, J. (Eds.): Ti-2003, Science and Technology, Proceedings of the 10th World Conference on Titanium. Vol. 4 Hamburg (D), 13.-18.07.2003, 2004. 2401 - 2408. (ISBN: 3-527-30306-5)
