Weak-beam TEM study on planar fault energies of Al-lean TiAl-base alloys
No abstract available.
URL: https://publications.hereon.de/id/21346/
Authors:Zhang, W.-J.,Appel, F.
Year:2002
In: Materials Science and Engineering A
Volume:334
Pages:59-64
Type:journal article
ISSN: 0921-5093
Cite as: Zhang, W.; Appel, F.: Weak-beam TEM study on planar fault energies of Al-lean TiAl-base alloys. Materials Science and Engineering A. 2002. vol. 334, 59-64.