Internal Stress Measurements by High-Energy Synchrotron X-Ray Diffraction at Increased Specimen-Detector Distance

Publication

No abstract available.

URL: https://publications.hereon.de/id/21047/
Authors:Boehm, J., Wanner, a., Kampmann, R., Franz, H., Liss, K.-D., Schreyer, A., Clemens, H.
Year:2002
In: E-MRS Spring Meeting 2002, Symposium
Location:Strasbourg (F)
Date:18.-21.06.2002
Cite as: Boehm, J.; Wanner, a.; Kampmann, R.; Franz, H.; Liss, K.-D.; Schreyer, A.; Clemens, H.: Internal Stress Measurements by High-Energy Synchrotron X-Ray Diffraction at Increased Specimen-Detector Distance. In: E-MRS Spring Meeting 2002, Symposium. Strasbourg (F), 18.-21.06.2002, 2002.