Laterally graded multilayer optics for x-ray analysis

Confpaper

No abstract available.

URL: https://publications.hereon.de/id/18485/
Authors:Schuster, M., Goebel, H., Bruegemann, L., Bahr, D., Burgaezy, F., Michaelsen, C., Stoermer, M., Ricardo, P., Dietsch, R., Holz, T., Mai, H.
Year:1999
In: SPIE, EUV, X-Ray, and Neutron Optics and Sources
Volume:3767
Location:Denver, CO (USA)
Date:18.-23.07.1999
Pages:183 - 198
Type:Confpaper
Cite as: Schuster, M.; Goebel, H.; Bruegemann, L.; Bahr, D.; Burgaezy, F.; Michaelsen, C.; Stoermer, M.; Ricardo, P.; Dietsch, R.; Holz, T.; Mai, H.: Laterally graded multilayer optics for x-ray analysis. In: SPIE, EUV, X-Ray, and Neutron Optics and Sources. Vol. 3767 Denver, CO (USA), 18.-23.07.1999, 1999. 183 - 198.