Ex-Situ Characterization of Phase Transformations and Associated Microstructures in Polycrystalline Thin Films
No abstract available.
URL: https://publications.hereon.de/id/16093/
Authors:Barmak, K., Rickman, J. M., Michaelsen, C., Ristau, R. A., Kim, J., Lucadamo, G., Carpenter, D. T., Tong, W. S.
Year:1999
In: Journal of Vacuum Science and Technology A
Volume:17
Pages:1950 - 1957
Type:Journalpaper
ISSN: 0734-2101
Cite as: Barmak, K.; Rickman, J. M.; Michaelsen, C.; Ristau, R. A.; Kim, J.; Lucadamo, G.; Carpenter, D. T.; Tong, W. S.: Ex-Situ Characterization of Phase Transformations and Associated Microstructures in Polycrystalline Thin Films. In: Journal of Vacuum Science and Technology A. Vol. 17 (1999) 1950 - 1957.
