Surface analysis using total reflection X-ray fluorescence spectroscopy
No abstract available.
URL: https://publications.hereon.de/id/15520/
Authors:Schwenke, H., Knoth, J., Weisbrod, U.
Year:1990
In: Pittsburgh Conference
Location:New York, NY (USA)
Date:05.-09.03.1990
Cite as: Schwenke, H.; Knoth, J.; Weisbrod, U.: Surface analysis using total reflection X-ray fluorescence spectroscopy. In: Pittsburgh Conference. New York, NY (USA), 05.-09.03.1990, 1990.
