Some potential developments for trace element and surface analysis using a grazing incident X-ray beam
No abstract available.
URL: https://publications.hereon.de/id/15517/
Authors:Schwenke, H.,Bormann, R.,Knoth, J.,Prange, A.
Year:1992
In: The 4th Workshop on Total-Reflection X-Ray Fluorescence Spectrometry; Book of Abstracts
Location:Geesthacht (D)
Date:12.-15.05.1992
Type:conference lecture
Cite as: Schwenke, H.; Bormann, R.; Knoth, J.; Prange, A.: Some potential developments for trace element and surface analysis using a grazing incident X-ray beam. The 4th Workshop on Total-Reflection X-Ray Fluorescence Spectrometry; Book of Abstracts. Geesthacht (D), 1992.