Depth profiling using total reflection X-ray fluorescence spectrometry alone and in combination with ion beam sputtering
No abstract available.
URL: https://publications.hereon.de/id/13053/
Authors:Schwenke, H.,Knoth, J.,Guenther, R.,Wiener, G.,Bormann, R.
Year:1997
In: Spectrochimica Acta B
Volume:52
Pages:795-803
Type:journal article
ISSN: 0584-8547
Cite as: Schwenke, H.; Knoth, J.; Guenther, R.; Wiener, G.; Bormann, R.: Depth profiling using total reflection X-ray fluorescence spectrometry alone and in combination with ion beam sputtering. Spectrochimica Acta B. 1997. vol. 52, 795-803.
