The potential of TXRF as a primary method in chemical metrology
No abstract available.
URL: https://publications.hereon.de/id/12757/
Authors:Neidhart, B.,Knoth, J.,Schwenke, H.
Year:1998
In: Accreditation and Quality Assurance
Volume:3
Issue:11
Pages:470-472
Type:journal article
ISSN: 0949-1775
Cite as: Neidhart, B.; Knoth, J.; Schwenke, H.: The potential of TXRF as a primary method in chemical metrology. Accreditation and Quality Assurance. 1998. vol. 3, no. 11, 470-472.
