Examination of layered structures by total reflection X-ray fluorescence analysis

journal article,GKSS report

No abstract available.

URL: https://publications.hereon.de/id/12490/
Authors:Knoth, J.,Bormann, R.,Gutschke, R.,Michaelsen, C.,Schwenke, H.
Year:1993
In: Spectrochimica Acta B
Volume:48
Issue:2
Pages:285-292
Type:journal article,GKSS report
ISSN: 0584-8547
Cite as: Knoth, J.; Bormann, R.; Gutschke, R.; Michaelsen, C.; Schwenke, H.: Examination of layered structures by total reflection X-ray fluorescence analysis. Spectrochimica Acta B. 1993. vol. 48, no. 2, 285-292.