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Journalpaper

Interfacial Wetting and Perlocation Threshold in Ultrathin Ni/C Multilayer Films

No abstract available.
  • URL: https://publications.hereon.de/id/1082/
  • Authors:Borchers, C., Ricardo, P., Michaelsen, C.
  • Year:2000
  • In: Philosophical Magazine A
  • Volume:80
  • Issue:7
  • Pages:1669 - 1679
  • Type:Journalpaper
  • ISSN: 0141-8610
  • Cite as: Borchers, C.; Ricardo, P.; Michaelsen, C.: Interfacial Wetting and Perlocation Threshold in Ultrathin Ni/C Multilayer Films. In: Philosophical Magazine A. Vol. 80 (2000) 7, 1669 - 1679.
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